Mathematical Modelling Thermistors

 Please click on the section below to view your area of interest:

bullet Introduction
bullet Alpha (Temperature Coefficient)
bullet Application Notes
bullet BetaCURVE and BetaCHIP Products
bullet Chip Configuration
bullet Circuit Notes
bullet Exponential Model of NTC Thermistors Beta Value,ß , or Sensitivity Index
bullet Factors affecting measured resistance value of thermistors
bullet Mathematical Modelling of Thermistors
bullet Modelling of Conduction in Thermistors
bullet Resistance
bullet Self heating effect of thermistors
bullet Slope (Resistance Ratio)
bullet Specification of thermistors for applications
bullet Stability & reliability of thermistors
bullet Steinhart Coefficients for BetaTHERM standard part numbers
bullet Technical Note from Analog Devices
www.analog.com/adn8830
bullet The Steinhart-Hart Thermistor Equation
bullet Thermal Time Constant (T.C.)
bullet Thermal Dissipation Constant (D.C.)
bullet Tolerance of Thermistors
bullet Technical Note from Analog Devices
www.analog.com/adn8830
bullet Volume Resistivity
bullet Voltage–Current Characteristics
bullet Zero-power resistance characteristic

Mathematical Modelling of Thermistors:

One of the core physical assumptions of the band gap theory of solid state physics is that charge carrier concentration has an exponential dependence on absolute temperature. The charge carriers can be either negatively charged (n-type) electrons, or positively charged (p-type) holes. The p-type conduction mechanism is the trapping of electrons by fixed positively charged sites. The electrons move between these sites so that the net effect is that of mobile positively charged carriers moving in an electric field, in the opposite direction to negatively charged electrons.
It can be demonstrated theoretically from the chemical composition of the components and experimentally from Hall effect measurements that the metal oxide thermistor materials are p-type semiconductors. More details on the determination of carrier types can be found in reference text books on ceramic materials.
The expression for the density of carriers available in "ideal" semiconductor material can be derived directly from application of Quantum Mechanics to Solid State theory. This involves applying the Fermi-Dirac distribution to the calculation of energy states for charge carriers in the material. The process leads to an equation that describes the intrinsic carrier density in terms of some material constants and physical constants. The results derived in this way are expressed in an equation of the form:

Where :
ni is the intrinsic carrier density in appropriate units
T is the absolute temperature in Kelvin.
k is Boltzmann’s constant (1.38066 x 10-23 ) J/K
Further analysis of "ideal" semiconductor materials using principles of solid state physics relates the electrical resistivity of the material to the carrier density. The resulting expression is in the form of :

Where r is the material resistivity, in appropriate units, such as ohm-cm.
The equation can be reduced to a simpler format by writing it as:

This equation relates the resistivity of semiconductor material to the exponential of the reciprocal of absolute temperature, directly from fundamental principles of solid state physics.
As stated previously, an equation of this form is relevant for an "ideal" material with a regular crystal structure. Although the metal oxide thermistor materials are not "ideal", intuition based on the foregoing discussion would suggest that there should be an exponential aspect to the relationship between material resistivity and the reciprocal of absolute temperature.
Inspection of a graph of the natural log of measured Resistivity values versus the reciprocal of absolute temperature for thermistor materials, indicate that such a model is appropriate.


Graph # 4

The Resistance (R) of a piece of material of resistivity (ohm-cm) is proportional to this resistivity value.
R = x (t/A)
where:
R is the resistance in ohms,
t is thickness of the material (length of current path),
A is the cross-sectional area.
It follows that the expression for resistance as a function of temperature can be stated as:

Where RT denotes Resistance in ohms at temperature T Kelvin.

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